國立政治大學統計學系
學 術 演 講
主講人：Prof. Arthur B. Yeh 葉百堯教授 學 術 演 講
Department of Applied Statistics and Operations Research,
Bowling Green State University
題 目：A Nonparametric Phase I Control Chart for Monitoring
Scale Parameter Based on Empirical Likelihood Ratio
時 間：民國111年6月29日 (星期三) 上午11：00
地 點：國立政治大學商學院260903教室
摘 要：
Among the statistical process control techniques, the control chart has been proven to be effective in process monitoring. The Shewhart chart is one of the most commonly used control charts for monitoring the process mean and variability based on the assumption that the distribution of the quality characteristic to be monitored is normal. However, especially in non-manufacturing control chart applications, many of the quality characteristics to be monitored are not normally distributed.
Most of the existing nonparametric control charts are designed for Phase II monitoring. Little has been done in developing nonparametric Phase I control charts especially for individual observations. In this work, we propose a new nonparametric Phase I control chart for monitoring the scale parameter based on the empirical likelihood ratio test. The simulation results show that the proposed chart is more effective than the existing charts in terms of signal probability. A real example is used to demonstrate how the proposed chart can be applied in practice.
