Year	2025
Authors	Yi-Shian Dong
Paper Title	董奕賢;彭健育*, 2025.09, 'Importance inference of optimal test planning for degradation analysis, ' IEEE Transactions on Reliability, Vol.74, No.3, pp.4426-4440.(SCI)(*為通訊作者)
Vol.No	140941
Date of Publication	2025-09-01